Tecnai G2 20 TWIN (FEI)

tecnai 2015

 

Data sheet:

TEM point resolution (nm)                              0.27 

TEM line resolution (nm)                                0.144 

Minimum focus step (nm)                               2 

TEM magnification range                                25 x - 700 kx 

Camera length (mm)                                      52 - 6,000 

Maximum diffraction angle                              ±10° 

STEM resolution (nm)                                    1.0 

STEM magnification range                              100 x - 5 Mx 

Maximum tilt angle with double-tilt holder         ±70° 

Maximum tilt angle with tomography holder      ±80° 

EDS solid angle (srad)                                   0.13

 

Electron source

 
• Flexible high tension (20, 40, 80, 120, 160, 200 kV and values in between)
 

• LaB6 emitter

Imaging
 
• High tilt and large field of view (± 70° tilt for TWIN and double-tilt holder)
 
• Coma-free alignment for high resolution objective lens centering
 
• Ranged, rotation-free magnification and diffraction series
 
• Magnification reproducible within ± 1.5% 
 
• Embedded CCD and/or energy filter
 

• Plate camera with 56 sheets of film

Diffraction
 

• Wide range of diffraction techniques, from coherent illumination for selected area diffraction or micro-diffraction to highly convergent (large angle) beam diffraction

 
• Energy filtered diffraction down to low camera length (<200 mm): maximum visible diffraction angle ± 125 mrad STEM
 
• Fully digital scan system
 
• Bright Field and High Angle Annular Dark Field mode 
 

• EDX microanalysis TIA

• Precession electron diffraction DigiStar and ASTAR for orientation- and phase mapping

 

<--wstecz