• Quantitative characterization of macro-, micro- and nanostructure of materials with the aid of light and electron microscopy (also at the atomic level)
• Electron tomography of materials: imaging of the micro- and nanostructure of materials in three-dimensional space; metrology

• Investigation of the electric and magnetic fields with the aid of electron holography

• Investigation of materials surfaces with the aid of atomic force microscopy

• Investigation of physical and mechanical properties of materials




• Materials for energy systems and aeronautics:  

                 → Nickel-based superalloys

                 → Titanium and aluminium alloys

                 → Intermetallics

                 → Materials for extreme environment (tungsten alloys, ODS steels/alloys)

                 → Steels and cast steels

• Graded and multilayered materials:


                 → Functionally graded materials

                 → Multi-layered materials: wear- and erosion resistant coatings; oxidation

                    resistant coatings

• Biomaterials


                 → Nanostructural modification of the implant surfaces

                 → Metallic biomaterials

                 → Shape-memory alloys

                 → Materials for tissue scaffolds


• Other advanced materials


                 → Nanomaterials

                 → Modern ceramic materials

                 → Complex metallic alloys (CMAs)

                 → Metal-ceramic composites

                 → Modern magnetic materials (e.g. giant magnetoresistant materials, GMRs)

                 → Polymers 




• Light microscopy (LM), quantitative metallography 

• Scanning electron microscopy (SEM), fractography

• Transmission electron microscopy (TEM)

        →  Quantitative characterization of materials micro- and nanostructure by analytical

             electron microscopy methods, also at the atomic level: 


                   -  Analysis of microstructure and determination of microstructural parameters

                      with the aid of various imaging and diffraction methods 


                   -  Analysis of materials' microstructure at the atomic level with the aid of

                      STEM-HAADF imaging with spherical aberration correction 


                   -  Orientation and phase mapping in nanoareas


        →  Diffraction analyses: Selected area electron diffraction (SAED); Convergent beam

             electron diffraction (CBED); Micro- and nanodiffraction (μD, NBD); Precession

             electron diffraction (PED) 


        →  Phases identification in multiphase and multilayered materials with the aid of

            diffraction and spectroscopy methods supported by specialized software 


        →  High resolution transmission electron microscopy (HRTEM)


        →  Chemical analyses (qualitative and quantitative) by spectroscopy methods:


                  - Energy dispersive X-ray spectroscopy (EDS) with a possibility of collecting

                    elemental distribution maps at the atomic level 


                  - Electron energy loss spectroscopy (EELS)


                  - Elemental distribution maps by energy filtered transmission electron

                    microscopy (EFTEM) 


        →  Investigation of the electric and magnetic fields with the aid of electron

            holography; Lorentz microscopy

• Electron tomography (HAADF, EFTEM, FIB-SEM-FIB) for reconstruction of three-dimensional images of materials micro- and nanostructure, metrology

• Atomic force microscopy

• Image analysis with the aid of: 

       →  JEMS, Digital Micrograph, AnalySIS 3.2, Aphelion, ImageJ, Avizo Fire 6 and others 

• Mechanical properties investigation

• Non-destructive examination of materials

      →  Ultrasonic
      →  Eddy-current 
      →  Acoustic emission

• In vitro cell laboratory: basic biocompatibility investigations with cell lines