Data sheet:
| TEM point resolution (nm) | 0.27 |
| TEM line resolution (nm) | 0.144 |
| Minimum focus step (nm) | 2 |
| TEM magnification range | 25 x – 700 kx |
| Camera length (mm) | 52 – 6,000 |
| Maximum diffraction angle | ±10° |
| STEM resolution (nm) | 1.0 |
| STEM magnification range | 100 x – 5 Mx |
| Maximum tilt angle with double-tilt holder | ±70° |
| Maximum tilt angle with tomography holder | ±80° |
| EDS solid angle (srad) | 0.13 |
Electron source
- Flexible high tension (20, 40, 80, 120, 160, 200 kV and values in between)
- LaB6 emitter
Imaging
- High tilt and large field of view (± 70° tilt for TWIN and double-tilt holder)
- Coma-free alignment for high resolution objective lens centering
- Ranged, rotation-free magnification and diffraction series
- Magnification reproducible within ± 1.5%
- Embedded CCD and/or energy filter
- Plate camera with 56 sheets of film
Diffraction
- Wide range of diffraction techniques, from coherent illumination for selected area diffraction or micro-diffraction to highly convergent (large angle) beam diffraction
- Energy filtered diffraction down to low camera length (<200 mm): maximum visible diffraction angle ± 125 mrad STEM
- Fully digital scan system • Bright Field and High Angle Annular Dark Field mode
- EDX microanalysis TIAPrecession electron diffraction DigiStar and ASTAR for orientation- and phase mapping
