{"id":218,"date":"2024-03-07T12:27:19","date_gmt":"2024-03-07T11:27:19","guid":{"rendered":"http:\/\/www.tem.agh.edu.pl\/main_nowastrona\/?p=218"},"modified":"2024-03-07T12:28:06","modified_gmt":"2024-03-07T11:28:06","slug":"merlin-gemini-ii-zeiss","status":"publish","type":"page","link":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/merlin-gemini-ii-zeiss\/","title":{"rendered":"Merlin Gemini II (ZEISS)"},"content":{"rendered":"\n
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MERLIN with the GEMINI II column and FEG electron source offers high resolution imaging using advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective back-scattered detector (AsB), 3DSM and STEM. Gemini II optics imaging setting such as voltage or probe current can be adjusted without realignment. Parallel on-axis in-lens secondary electron (SE) and energy selective backscattered (EsB) detection can easily identify smallest differences in materials composition.<\/p>\n\n\n\n

Data<\/strong><\/p>\n\n\n\n

Electron source<\/td>Schottky Field Emission Gun (FEG)<\/td><\/tr>
Resolution<\/td>up to 0.6nm (STEM mode)<\/td><\/tr>
Probe current<\/td>
up to 300nA<\/td><\/tr>
Acceleration voltage<\/td>20V to 30 kV<\/td><\/tr>
Detection Modes (selection)<\/td><\/td><\/tr>
In-lens (SE)<\/td>on-axis in-lens\u00a0secondary electron detection<\/td><\/tr>
In-lens (EsB)<\/td>
on-axis in-lens\u00a0energy selective backscattered detection\u00a0for advanced materials contrasts; parallel in-lens SE and EsB imaging<\/td><\/tr>
Angle selective backscattered Detector (AsB)<\/td>For crystallographic contrasts.<\/td><\/tr>
3DSM<\/td>For real time\u00a03D surface topography\u00a0visualization.<\/td><\/tr>
STEM<\/td>Low voltage optimized bright field, 4 quadrant dark field, and high angular dark field transmission imaging.<\/td><\/tr>
Application Modules (selection)<\/td><\/td><\/tr>
Local charge compensation<\/td>
Image non-conducting samples without any compromises in detection.<\/td><\/tr>
Quantax\u00a0800\u00a0<\/td>EDX\u00a0microanalysis system<\/td><\/tr>
Quantax\u00a0CrystAlign\u00a0400<\/td>EBSD analysis system<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
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MERLIN with the GEMINI II column and FEG electron source offers high resolution imaging using advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective back-scattered detector (AsB), 3DSM and STEM. Gemini II optics imaging setting such as voltage or probe current can be adjusted without realignment. Parallel on-axis in-lens secondary electron (SE) and energy […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"open","ping_status":"open","template":"","meta":{"footnotes":""},"class_list":["post-218","page","type-page","status-publish","hentry","post-preview"],"_links":{"self":[{"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/pages\/218","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/comments?post=218"}],"version-history":[{"count":3,"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/pages\/218\/revisions"}],"predecessor-version":[{"id":228,"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/pages\/218\/revisions\/228"}],"wp:attachment":[{"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/media?parent=218"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}