{"id":231,"date":"2024-03-07T13:22:50","date_gmt":"2024-03-07T12:22:50","guid":{"rendered":"http:\/\/www.tem.agh.edu.pl\/main_nowastrona\/?p=231"},"modified":"2024-03-07T13:42:10","modified_gmt":"2024-03-07T12:42:10","slug":"crossbeam-350-zeiss","status":"publish","type":"page","link":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/crossbeam-350-zeiss\/","title":{"rendered":"Crossbeam 350 (Zeiss)"},"content":{"rendered":"\n
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The FIB (Focused Ion Beam) is, in many ways, the \u2018Swiss Army Knife\u2019 of microscopy. These instruments operate in a number of modes and provide data, either directly or indirectly, through a number of approaches. That is, they can be used for preparation and direct observation of structural cross-sections, the preparation of transmission electron microscope (TEM) and atom probe (AP) specimens, the generation of microstructural data in three dimensions and in nanofabrication of devices and prototypes [P.R. Munroe].<\/p>\n\n\n\n

FIB Zeiss Crossbeam 350 <\/p>\n\n\n\n

The CrossBeam 350 platform features the highly acclaimed benefit of a fully integrated energy and angle selective backscattered electron detector for advanced compositional information and ultra-high BSE imaging at very short working distances. The EsB detector is less sensitive for edge contrast and charging effects which enables precise feature imaging and reliable metrology. Equipped with the sophisticated Canion FIB the system allows fast and precise cross sectioning and TEM preparation. Delivering superb materials contrast and crystallographic imaging, the CrossBeam 350 is the instrument for all three dimensional analytical applications [Carl Zeiss NTS GmbH]<\/p>\n\n\n\n

Data<\/p>\n\n\n\n

SEM Resolution<\/td>0.9nm at 15kV, 1nm at 1kV<\/td><\/tr>
SEM Probe Current<\/td>2pA – 20nA<\/td><\/tr>
SEM Acceleration Voltage<\/td>30V – 30kV<\/td><\/tr>
SEM Emiter<\/td>Schottky Field Emiter<\/td><\/tr>
FIB Resolution<\/td>3nm at 30kV<\/td><\/tr>
FIB Probe Current<\/td>1pA – 100nA<\/td><\/tr>
FIB Acceleration Voltage<\/td>500V – 30kV<\/td><\/tr>
FIB Emiter<\/td>Ga liquid metal ion source (LMIS)<\/td><\/tr>
Gas Injection System<\/td>2x single GIS (C and Pt) <\/td><\/tr>
Detectors<\/td>in-lens SE standard Everhart-Thorrnley
SE2 – detector,
EsB with filtering grid (BSE), filtering grid voltage 0 – 1500 V, 4QBSD<\/td><\/tr>
Specimen Chaber<\/td>330 mm in diameter , 270 mm height, 2 x  IR CCD-camera for sample viewing<\/td><\/tr>
Specimen Stage<\/td>6-axes fully eucentric, all motorized<\/td><\/tr>
Image Acquisition<\/td>Resolution: from 512 x 384 to 32072 x 24304 pixel, Processing: Pixel averaging, frame averaging, continuous averaging<\/td><\/tr>
System Control<\/td> Integrated CrossBeam\u00ae\/SmartSEMTM GUI <\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n

Additional equipment:<\/strong><\/p>\n\n\n\n

QUANTAX EDS<\/strong> systems – ultimate analytical performance in microanalysis<\/p>\n\n\n\n

XFlash\u00ae 5010, the light element specialist: This detector has excellent energy resolution, a \u2264125 eV, The detection range spans the elements from beryllium to americium.<\/p>\n\n\n\n

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The FIB (Focused Ion Beam) is, in many ways, the \u2018Swiss Army Knife\u2019 of microscopy. These instruments operate in a number of modes and provide data, either directly or indirectly, through a number of approaches. That is, they can be used for preparation and direct observation of structural cross-sections, the preparation of transmission electron microscope […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"open","ping_status":"open","template":"","meta":{"footnotes":""},"class_list":["post-231","page","type-page","status-publish","hentry","post-preview"],"_links":{"self":[{"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/pages\/231","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/comments?post=231"}],"version-history":[{"count":8,"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/pages\/231\/revisions"}],"predecessor-version":[{"id":282,"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/pages\/231\/revisions\/282"}],"wp:attachment":[{"href":"https:\/\/www.tem.agh.edu.pl\/main_nowastrona\/wp-json\/wp\/v2\/media?parent=231"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}