Titan Cubed G2 60-300 (FEI) - a probe Cs corrected (S)TEM for analytical high resolution microscopy (70pm) at high (300 kV) and low (60 kV) voltage equipped with:
- new X-FEG Schottky high brightness source with a monochromator
- high resolution STEM-HAADF unit with a new dodecapole DCOR probe Cs corrector
- new ChemiSTEM EDX system based on a 4 windowless Silicon Drift Detectors (Super X) with enhanced acquisition efficiency and speed for low dose, high spatial (atomic) resolution and fast chemical element mapping
- GIF Quantum 693 electron energy filter for EELS spectroscopy and EFTEM imaging
- new FEI precession electron diffraction
- dual-axis tomography: double tilt holder with 3D reconstruction and visualization software
- off-axis electron holography, Lorentz lens
- full remote access operation (TARO)
- Novel double tilt MEMS-based heating (up to 1300°C) holder (purchased in 2018 within the NCN project 2016/23/B/ST8/00537)
S(TEM) Titan Cubed G2 60-300 microscope was purchased within the project „Acquisition of an advanced analytical transmission electron microscope with unique instrumentation for analyses of materials nanostructure and chemical composition investigation at the atomic scale" (scientific leader: Prof. A. Czyrska-Filemonowicz), project nr POIG.02.01.00-12-016/08-00 within the Innovative Economy Programme, 2007-2013, Priority 2: R+D sphere Infrastructure, Activity 2.1: Development of centers with a high research potential.